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NF P34-310 (04/2017)
NF P34-310 (04/2017) Continuously hot-dip zinc coated structural steel...
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JIS B 8837-1:2010 (R2014)
JIS B 8837-1:2010 (R2014) Cranes - Maintenance - Part 1: General
$10.50 $25.00 -58%Reduced price!In Stock -
JIS B 8827-3:2010 (R2014)
JIS B 8827-3:2010 (R2014) Cranes - Limiting and indicating devices - Part 3: Tower cranes
$10.50 $25.00 -58%Reduced price!In Stock -
JIS B 8834:2010 (R2014)
JIS B 8834:2010 (R2014) Cranes - Stiffness - Bridge and gantry cranes
$10.50 $25.00 -58%Reduced price!In Stock -
JIS B 3000:2010 (R2014)
JIS B 3000:2010 (R2014) Factory Automation - Vocabulary
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JIS C 5750-1:2010 (R2014)
JIS C 5750-1:2010 (R2014) Dependability management - Part 1: Dependability management systems
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JIS A 5558:2010 (R2015)
JIS A 5558:2010 (R2015) Unplasticized polyvinyl chloride (PVC-U) profiles for fabrication of windows and doors
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JIS K 6217-5:2010 (R2015)
JIS K 6217-5:2010 (R2015) Carbon black for rubber industry - Fundamental characteristics - Part 5 : Determination of tinting strength
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JIS K 0163:2010 (R2015)
JIS K 0163:2010 (R2015) Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials
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JIS K 0162:2010 (R2015)
JIS K 0162:2010 (R2015) Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
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JIS K 0161:2010 (R2015)
JIS K 0161:2010 (R2015) Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
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JIS K 0190:2010 (R2015)
JIS K 0190:2010 (R2015) Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
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JIS K 0164:2010 (R2015)
JIS K 0164:2010 (R2015) Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
$10.50 $25.00 -58%Reduced price!In Stock
