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EIA JESD 354:1968 (R2009)
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EIA JESD 354:1968 (R2009)
The Measurement of Transistor Equivalent Noise Voltage and Equivalent Noise Current at Frequencies of up to 20 kHzMore info
GENERAL The test set-up must be very well shielded, grounded, and securely interconnected to prevent pick-up of unwanted signals and generation of additional noise.
| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| Confirmation date | 2009-03-01 |
| ICS | 17.140.20 : Noise emitted by machines and equipment
31.080.30 : Transistors |
| Number of pages | 14 |
| Year | 1960 |
| Document history | |
| Country | USA |
| Keyword | EIA 354;354;EIA-354;EIA JESD354 |