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EIA JEB 15:1969
New product
EIA JEB 15:1969
Terminology and Methods of Measurement for Bistable Semiconductor MicrocircuitsMore info
| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| ICS | 01.040.31 : Electronics (Vocabularies)
31.080.01 : Semiconductor devices in general |
| Number of pages | 95 |
| Year | 1960 |
| Document history | |
| Country | USA |
| Keyword | EIA 15;15;EIA JEB15 |