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EIA CB-5:1969
New product
EIA CB-5:1969
Recommended Test Procedure for Semiconductor Thermal Dissipating DevicesMore info
| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| ICS | 31.080.01 : Semiconductor devices in general
|
| Number of pages | 17 |
| Modified by | EIA CB-5-1 (1971-05)
|
| Year | 1960 |
| Document history | |
| Country | USA |
| Keyword | EIA 5;5;EIA CB 5 |