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The purpose of this Guideline is to provide a vehicle for acquiring and transmitting the necessary information in a concise, organized, and consistent format. Included in the Guideline is a sample form that facilitates transferring the maximum amount of background data to the failure analyst in a readily interpretable format. Immediate availability of this key information assists that analyst in completing a timely and accurate failure analysis.
Author | EIA |
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Editor | EIA |
Document type | Standard |
Format | File |
ICS | 31.080.01 : Semiconductor devices in general
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Number of pages | 14 |
Year | 1990 |
Document history | |
Country | USA |
Keyword | EIA 134;134;EIA JEP134 |