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EIA JESD 51-6:1999
New product
EIA JESD 51-6:1999
Integrated Circuit Thermal Test Method Environmental Conditions - Forced Convection (Moving Air)More info
This standard specifies the environmental conditions for determining thermal performance of an integrated circuit device in a forced convection environment when mounted on a standard thermal test board.
| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| ICS | 31.080.01 : Semiconductor devices in general
|
| Number of pages | 20 |
| Year | 1990 |
| Document history | |
| Country | USA |
| Keyword | EIA JESD 51;EIA 51;EIA 51.6;51;EIA JESD51-6 |