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This test procedure provides only a cumulative return loss for systems or links being tested. This procedure also provides a reflectance measurement for discrete components. If the reflectance for individual components in series within a system must be analyzed, FOTP-8 should be used in lieu of this procedure. This procedure offers two methods for measuring reflected power using a branching device and loss test set(s). These test methods may be destructive in nature and therefore not desirable for production testing. Annex A offers specialized variations of the test methods, for use in the non-destructive testing of connectorized assemblies.
Author | EIA/TIA |
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Editor | EIA |
Document type | Standard |
Format | File |
ICS | 33.180.20 : Fibre optic interconnecting devices
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Number of pages | 30 |
Replace | EIA/TIA-455-107 (1989-02) |
Cross references | ANSI/TIA-455-107A (1999), IDT |
Year | 1990 |
Document history | EIA/TIA-455-107-A (1999-03) |
Country | USA |
Keyword | EIA 455;EIA 455.107;EIA/TIA 455;EIA/TIA-455;EIA/TIA-455-107;455;TIA/EIA-455-107A;EIA TIA-455-107-A |