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EIA J-STD-028:1999

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EIA J-STD-028:1999

Performance Standard for Construction of Flip Chip and Chip Scale Bumps

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This standard establishes the construction detail requirements for bumps and other terminal structures on flip chips and chip scale carriers. All flip chip and chip scale device terminals shall meet the designated standards detailed in this document which includes such diverse terminations as solder bumps, columns, non-melting stand-offs and conductive polymer deposits. The specific standards for different terminations will therefore be appropriately matched to the particular interconnection.

Author EIA
Editor EIA
Document type Standard
Format File
ICS 31.220.01 : Electromechanical components in general
Number of pages 36
Cross references IPC EIA-J-STD-028 (1999-08), IDT
Year 1990
Document history
Country USA
Keyword EIA 028;028