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The purpose of these user guidelines is to provide background and an example for the use of an infrared (IR) microscope to determine die temperature of electronic devices for calculations such as thermal resistance.
Author | EIA |
---|---|
Editor | EIA |
Document type | Standard |
Format | File |
ICS | 37.080 : Document imaging applications
|
Number of pages | 10 |
Year | 1990 |
Document history | |
Country | USA |
Keyword | EIA 138;138;EIA JEP138 |