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This publication covers recommended methods for measurement of transistor lead temperatures under various load conditions. The techniques described are sufficiently accurate for most applications.
Author | EIA |
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Editor | EIA |
Document type | Standard |
Format | File |
ICS | 31.080.30 : Transistors
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Number of pages | 12 |
Replace | EIA JEP 84 (1973) |
Year | 2004 |
Document history | EIA JEP 84A (2004-06) |
Country | USA |
Keyword | EIA 84A;84A;EIA JEP84A |