Cart
0
Product
Products
(empty)
No products
To be determined
Shipping
$0.00
Total
Product successfully added to your shopping cart
Quantity
Total
There are 0 items in your cart.
There is 1 item in your cart.
Total products
Total shipping
To be determined
Total
Reduced price!
View larger
View larger
EIA JESD 89-3A:2007 (R2012)
New product
EIA JESD 89-3A:2007 (R2012)
Test Method for Beam Accelerated Soft Error RateMore info
This test is used to determine the terrestrial cosmic ray Soft Error Rate (SER) sensitivity of solid state volatile memory arrays and bistable logic elements (e.g. flip-flops) by measuring the error rate while the device is irradiated in a neutron or proton beam of known flux. The results of this accelerated test can be used to estimate the terrestrial cosmic ray induced SER for a given terrestrial cosmic ray radiation environment. This test cannot be used to project alpha-particleinduced SER.
| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| Confirmation date | 2012-01-01 |
| ICS | 31.080.01 : Semiconductor devices in general
|
| Number of pages | 28 |
| Replace | EIA JESD 89-3 (2005-09) |
| Modify | EIA JESD 89A (2006-10)
|
| Year | 2007 |
| Document history | EIA JESD 89-3A (2007-11) |
| Country | USA |
| Keyword | EIA JESD 89;EIA 89;EIA 89.3A;89;EIA JESD89-3A |