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EIA JESD 22-B108B:2010
New product
EIA JESD 22-B108B:2010
Coplanarity Test for Surface-Mount Semiconductor DevicesMore info
The purpose of this test is to measure the deviation of the terminals (leads or solder balls) from coplanarity at room temperature for surface-mount semiconductor devices. This test method is applicable for inspection and device characterization. If package warpage or coplanarity is to be characterized at reflow soldering temperatures, then JESD22-B112 should be used.
| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| ICS | 31.080.01 : Semiconductor devices in general
|
| Number of pages | 14 |
| Replace | EIA JESD 22-B108A (2003-01) |
| Year | 2010 |
| Document history | EIA JESD 22-B108B (2010-09) |
| Country | USA |
| Keyword | EIA JESD 22;EIA 22;EIA 22.B108B;22;EIA JESD22-B108B |