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EIA JEP 163:2015

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EIA JEP 163:2015

Selection of Burn-In/Life Test Conditions and Critical Parameters for QML Microcircuits

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This publication is intended as a guideline to develop and establish conditions for burn-in and life test of MIL-PRF-38535 QML integrated circuits. These guidelines are intended to provide manufacturers with a consistent means of defining burn-in and life test stress and electrical test requirements acceptable to user organizations and for the development of Standard Military Drawings. The guidelines cover the entire design, wafer fabrication and manufacturing flows, including design and process awareness. Without design awareness (critical circuit blocks / functionality, etc.), burn-in / life test of an integrated circuit might be compromised, or it might dramatically shorten the device's life prior to system use.

Author EIA
Editor EIA
Document type Standard
Format File
ICS 31.200 : Integrated circuits. Microelectronics
Number of pages 28
Year 2015
Document history
Country USA
Keyword EIA 163;163;EIA JEP163