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EIA JESD 22-A103E:2015

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EIA JESD 22-A103E:2015

High Temperature Storage Life

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The test is applicable for evaluation, screening, monitoring, and/or qualification of all solid state devices. The high temperature storage test is typically used to determine the effects of time and temperature, under storage conditions, for thermally activated failure mechanisms and time-tofailure distributions of solid state electronic devices, including nonvolatile memory devices (data retention failure mechanisms). Thermally activated failure mechanisms are modeled using the Arrhenius Equation for acceleration. During the test, accelerated stress temperatures are used without electrical conditions applied. This test may be destructive, depending on time, temperature and packaging (if any).

Author EIA
Editor EIA
Document type Standard
Format File
ICS 35.220.01 : Data storage devices in general
Number of pages 12
Replace EIA JESD 22-A103D (2010-12)
Year 2015
Document history EIA JESD 22-A103E (2015-10)
Country USA
Keyword EIA JESD 22;EIA 22;EIA 22.A103E;22;EIA JESD22-A103E