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This document specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances. The frequency range of this method is from 150 kHz to 1 GHz, or as limited by the charcteristics of the TEM cell.
| Author | VDE |
|---|---|
| Editor | VDE |
| Document type | Standard |
| Format | Paper |
| ICS | 31.200 : Integrated circuits. Microelectronics
|
| Number of pages | 28 |
| Replace | DIN IEC 62132-2 (2006-08) |
| Cross references | EN 62132-2 (2011-03), IDT |
| Weight(kg.) | 0.1476 |
| Year | 2011 |
| Document history | DIN EN 62132-2 (2011-07) |
| Country | Germany |
| Keyword | DIN EN 62132;EN 62132;EN 62132-2;62132 |