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This part of IEC 61788 describes a test method to determine the retained critical current after the double bending at room temperature. The test methods are intended for use with short and straight Ag and/or Ag alloy-sheathed Bi-2223 superconducting wires that have a monolithic structure and a shape of flat or square tape containing mono- or multicores of oxides.
| Author | VDE |
|---|---|
| Editor | VDE |
| Document type | Draft |
| Format | Paper |
| expiration_de_validite | 2017-01-18 |
| ICS | 29.050 : Superconductivity and conducting materials
|
| Number of pages | 25 |
| Cross references | IEC 90/368/CD (2016-06), IDT |
| Weight(kg.) | 0.1425 |
| Year | 2016 |
| Document history | |
| Country | Germany |
| Keyword | DIN EN 61788;EN 61788;EN 61788-24;61788 |