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DIN EN 62435-2 VDE 0884-135-2:2017-10
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DIN EN 62435-2 VDE 0884-135-2:2017-10
Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms (IEC 62435-2:2017); German version EN 62435-2:2017More info
This part of DIN EN 62435 (VDE 0884-135) is related to deterioration mechanisms and is concerned with the way that components degrade over time depending on the storage conditions applied.
| Author | VDE |
|---|---|
| Editor | VDE |
| Document type | Standard |
| Format | Paper |
| ICS | 31.200 : Integrated circuits. Microelectronics
|
| Number of pages | 23 |
| Replace | DIN EN 62435-2 (2013-10) |
| Cross references | EN 62435-2 (2017-04), IDT |
| Weight(kg.) | 0.1391 |
| Year | 2017 |
| Document history | DIN EN 62435-2 (2017-10) |
| Country | Germany |
| Keyword | DIN EN 62435;EN 62435;EN 62435-2;62435 |