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This standard deals with the measurement of surface contamination by direct measurement using a calibrated surface contamination monitor. In some cases where for example the background may be high or the surface is inaccessible to a probe, assessment may be made by indirect measurement using a wipe test.
| Author | VDE |
|---|---|
| Editor | VDE |
| Document type | Standard |
| Format | Paper |
| ICS | 17.240 : Radiation measurements
|
| Number of pages | 43 |
| Replace | DIN ISO 7503-1 (1990-07) |
| Cross references | ISO 7503-1 (2016-01), IDT |
| Weight(kg.) | 0.1731 |
| Year | 2017 |
| Document history | DIN ISO 7503-1 (2017-12) |
| Country | Germany |
| Keyword | DIN ISO 7503;7503 |