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DIN EN 60749-17 VDE 0884-749-17:2018-07
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DIN EN 60749-17 VDE 0884-749-17:2018-07
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation (IEC 47/2465/CDV:2018); German and English version prEN 60749-17:2018More info
This part of series DIN EN 60749 (VDE 0884-749) provides the neutron irradiation test, which is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. These tests are applicable to integrated circuits and discrete semiconductor devices.
| Author | VDE |
|---|---|
| Editor | VDE |
| Document type | Draft |
| Format | Paper |
| expiration_de_validite | 2018-08-01 |
| ICS | 31.080.01 : Semiconductor devices in general
|
| Number of pages | 17 |
| Cross references | prEN 60749-17 (2018-04), IDT |
| Weight(kg.) | 0.1289 |
| Year | 2018 |
| Document history | |
| Country | Germany |
| Keyword | DIN EN 60749;EN 60749;EN 60749-17;60749 |