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JIS K 0167:2011 (R2015)
New product
JIS K 0167:2011 (R2015)
Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materialsMore info
| Author | JSA |
|---|---|
| Editor | JSA |
| Document type | Standard |
| Format | File |
| Confirmation date | 2015-10-20 |
| ICS | 71.040.40 : Chemical analysis
|
| Number of pages | 26 |
| Cross references | ISO 18118 (2004-05), IDT |
| Year | 2011 |
| Document history | |
| Country | Japan |
| Keyword | JIS 0167;0167 |