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This Japanese Industrial Standard applies to electrical equipment associated with semiconductor fabrication equipment for the manufacture, measurement, assembly, and test of semiconductors.
| Author | JSA |
|---|---|
| Editor | JSA |
| Document type | Standard |
| Format | File |
| Confirmation date | 2017-10-20 |
| ICS | 13.110 : Safety of machinery
31.080.01 : Semiconductor devices in general |
| Number of pages | 124 |
| Cross references | IEC 60204-33 (2009-12), IDT |
| Year | 2012 |
| Document history | |
| Country | Japan |
| Keyword | JIS B 9960;JIS 9960;9960 |