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JIS K 0153:2015

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JIS K 0153:2015

Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry

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Author JSA
Editor JSA
Document type Standard
Format File
ICS 71.040.50 : Physicochemical methods of analysis
Number of pages 14
Cross references ISO 23830 (2008-11), IDT
Year 2015
Document history
Country Japan
Keyword JIS 0153;0153