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1.1 This guide is an outline of methods for scanning electron microscopy (SEM) intended for use by forensic paint examiners. This guide is intended to supplement information presented in Guide E1610.
| Author | ASTM |
|---|---|
| Editor | ASTM |
| Document type | Standard |
| Format | File |
| ICS | 17.180.30 : Optical measuring instruments
87.040 : Paints and varnishes |
| Number of pages | 9 |
| Set | ASTMVOL1402 |
| Year | 2013 |
| Document history | |
| Country | USA |
| Keyword | ASTM 2809;ASTM E2809;ASTM E2809;10.1520/E2809-13 |