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ASTM F1263-11 + Redline

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ASTM F1263-11 + Redline

Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts

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1.1 This guide covers the use of overtesting in order to reduce the required number of parts that must be tested to meet a given quality acceptance standard. Overtesting is testing a sample number of parts at a stress level higher than their specification stress in order to reduce the amount of necessary data taking. This guide discusses when and how overtesting may be applied to forming probabilistic estimates for the survival of electronic piece parts subjected to radiation stress. Some knowledge of the probability distribution governing the stress-to-failure of the parts is necessary, although exact knowledge may be replaced by over-conservative estimates of this distribution.


Significance and Use:
Author ASTM
Editor ASTM
Document type Standard
Format File
ICS 31.020 : Electronic components in general
Number of pages 3
Replace ASTM F1263-99(2005) + Redline
Set ASTMVOL1004
Year 2011
Document history ASTM F1263-99(2005) + Redline
Country USA
Keyword ASTM 1263;ASTM F1263;ASTM F1263;10.1520/F1263-11