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ASTM E2444-11(2018)
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ASTM E2444-11(2018)
Standard Terminology Relating to Measurements Taken on Thin, Reflecting FilmsMore info
1.1 This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms are related to the standards in Section 2, which were generated by Committee E08 on Fatigue and Fracture. Terminology E1823 Relating to Fatigue and Fracture Testing is applicable to this standard.
| Author | ASTM |
|---|---|
| Editor | ASTM |
| Document type | Standard |
| Format | File |
| Confirmation date | 2018-05-01 |
| ICS | 01.040.31 : Electronics (Vocabularies)
31.240 : Mechanical structures for electronic equipment |
| Number of pages | 2 |
| Replace | ASTM E2444-11e1 |
| Set | ASTMVOL0301 |
| Year | 2011 |
| Document history | ASTM E2444-11e1 |
| Country | USA |
| Keyword | ASTM 2444;ASTM E2444;ASTM E2444;10.1520/E2444-11R18 |