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ASTM E1161-09(2014)
New product
ASTM E1161-09(2014)
Standard Practice for Radiologic Examination of Semiconductors and Electronic ComponentsMore info
1.1 This practice provides the minimum requirements for nondestructive radiologic examination of semiconductor devices, microelectronic devices, electromagnetic devices, electronic and electrical devices, and the materials used for construction of these items.
| Author | ASTM |
|---|---|
| Editor | ASTM |
| Document type | Standard |
| Format | File |
| Confirmation date | 2014-06-01 |
| ICS | 31.080.01 : Semiconductor devices in general
|
| Number of pages | 10 |
| Replace | ASTM E1161-09 |
| Set | ASTMVOL0303 |
| Year | 2009 |
| Document history | ASTM E1161-09 |
| Country | USA |
| Keyword | ASTM 1161;ASTM E1161;ASTM E1161;10.1520/E1161-09R14 |