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ASTM F744M-16
New product
ASTM F744M-16
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)More info
1.1 This test method covers the measurement of the threshold level of radiation dose rate that causes upset in digital integrated circuits only under static operating conditions. The radiation source is either a flash X-ray machine (FXR) or an electron linear accelerator (LINAC).
| Author | ASTM |
|---|---|
| Editor | ASTM |
| Document type | Standard |
| Format | File |
| ICS | 31.200 : Integrated circuits. Microelectronics
|
| Number of pages | 7 |
| Replace | ASTM F744M-10 |
| Set | ASTMVOL1004 |
| Year | 2016 |
| Document history | ASTM F744M-10 |
| Country | USA |
| Keyword | ASTM 744;ASTM F744;ASTM F744;10.1520/F0744M-16 |