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1.1 This practice covers the measurement of the response of linear integrated circuits, under given operating conditions, to pulsed ionizing radiation. The response may be either transient or more lasting, such as latchup. The radiation source is either a flash X-ray machine (FXR) or an electron linear accelerator (LINAC).
| Author | ASTM |
|---|---|
| Editor | ASTM |
| Document type | Standard |
| Format | File |
| ICS | 17.220.20 : Measurement of electrical and magnetic quantities
31.200 : Integrated circuits. Microelectronics |
| Number of pages | 6 |
| Replace | ASTM F773M-10 + Redline |
| Set | ASTMVOL1004 |
| Year | 2016 |
| Document history | ASTM F773M-10 + Redline |
| Country | USA |
| Keyword | ASTM 773;ASTM F773;ASTM F773;10.1520/F0773M-16 |