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ISO 18118:2015

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ISO 18118:2015

Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

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ISO 18118:2015 gives guidance on the measurement and use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials by Auger electron spectroscopy and X-ray photoelectron spectroscopy.

Author ISO/TC 201/SC 7 Electron spectroscopies
Editor ISO
Document type Standard
Format Paper
Edition 2
ICS 71.040.40 : Chemical analysis
Number of pages 26
Replace ISO 18118:2004
Weight(kg.) 0.1442
Year 2015
Country Switzerland