Could I help you?
Reduced price! View larger

ISO 17867:2015

New product

ISO 17867:2015

Particle size analysis — Small-angle X-ray scattering

More details

$49.20

-60%

$123.00

More info

Small-angle X-ray scattering (SAXS) is a well-established technique that allows structural information to be obtained about inhomogeneities in materials with a characteristic length from 1 nm to 100 nm. Under certain conditions (narrow size distributions, appropriate instrumental configuration, and idealised shape) the limit of 100 nm can be significantly extended. ISO 17687:2015 specifies a method for the application of SAXS to the estimation of mean particle sizes in dilute dispersions where the interaction between the particles is negligible. This International Standard allows two complementary data evaluation methods to be performed, model fitting and Guinier approximation. The most appropriate evaluation method shall be selected by the analyst and stated clearly in the report. SAXS is sensitive to electron density fluctuations. Therefore, particles in solution and pores in a matrix can be studied in same way.

Author ISO/TC 24/SC 4 Particle characterization
Editor ISO
Document type Standard
Format Paper
Edition 1
ICS 19.120 : Particle size analysis. Sieving
Number of pages 23
Weight(kg.) 0.1391
Year 2015
Country Switzerland