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Provides the quality assessment procedures and methods for electrical, climatic, mechanical and endurance tests, together with an outline of the requirements applicable to the release of film and hybrid film integrated circuits using either qualification or capability approval procedures.
| Author | BSI |
|---|---|
| Editor | BSI |
| Document type | Standard |
| Format | File |
| EAN ISBN | 0 580 17437 9 |
| ICS | 31.200 : Integrated circuits. Microelectronics
|
| Number of pages | 34 |
| Cross references | QC 760000:1988,IEC 60748-20:1988 |
| Modified by | AMD 6754 published September 1991 effective September 1991 Free of charge incorporated |
| Year | 1990 |
| Country | United Kingdom |
| Keyword | BS QC 760000 ; BSQC760000 ; BSQC 760000 ; BS QC760000 |