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BS IEC 62047-29:2017
New product
BS IEC 62047-29:2017
Semiconductor devices. Micro-electromechanical devices - Electromechanical relaxation test method for freestanding conductive thin-films under room temperatureMore info
| Author | BSI |
|---|---|
| Editor | BSI |
| Document type | Standard |
| Format | File |
| EAN ISBN | 978 0 580 94013 2 |
| ICS | 31.080.01 : Semiconductor devices in general
31.080.99 : Other semiconductor devices |
| Number of pages | 16 |
| Cross references | IEC 62047-29:2017 |
| Year | 2018 |
| Country | United Kingdom |