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ISO 16413:2013
New product
ISO 16413:2013
Evaluation of thickness, density and interface width of thin films by X-ray reflectometry — Instrumental requirements, alignment and positioning, data collection, data analysis and reportingMore info
| Author | ISO/TC 201 Surface chemical analysis |
|---|---|
| Editor | ISO |
| Document type | Standard |
| Format | Paper |
| Edition | 1 |
| ICS | 35.240.70 : IT applications in science
|
| Number of pages | 30 |
| Weight(kg.) | 0.1510 |
| Year | 2013 |
| Country | Switzerland |