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IEEE 1620.1
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IEEE 1620.1 2006 Edition, June 8, 2006 Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators
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Description / Abstract:
This standard describes a method for characterizing organic
electronic transistor-based ring oscillators, including measurement
techniques, methods of reporting data, and the testing conditions
during characterization.
Purpose
The purpose of this standard is to provide a method for systematically characterizing organic transistorbased ring oscillators. This standard is intended to maximize reproducibility of published results by providing a framework for testing organic ring oscillators, whose unique properties cause measurement issues not typically encountered with inorganic-based circuitry. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry.
Purpose
The purpose of this standard is to provide a method for systematically characterizing organic transistorbased ring oscillators. This standard is intended to maximize reproducibility of published results by providing a framework for testing organic ring oscillators, whose unique properties cause measurement issues not typically encountered with inorganic-based circuitry. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry.