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IEEE 1450.1
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IEEE 1450.1 2005 Edition, June 9, 2005 Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments
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Description / Abstract:
Structures are defined in STIL to support usage as semiconductor
simulation stimulus, including (1) mapping signal names to
equivalent design references, (2) interface between scan and
built-in self test (BIST) and the logic simulation, (3) data types
to represent unresolved states in a pattern, (4) parallel or
asynchronous pattern execution on different design blocks, and (5)
expression-based conditional execution of pattern constructs.
Structures are defined in STIL to support the definition of test patterns for sub-blocks of a design4 (i.e., embedded cores) such that these tests can be incorporated into a complete higher level device test.
Structures are defined in STIL to relate fail information from device testing environments back to original stimulus and design data elements.
Purpose
The STIL language definition is enhanced to support the usage of STIL in the design environment, which includes extending the execution concept to support STIL as a stimulus language, to allow STIL to be used as an intermediate form of data, and to allow STIL to capture design information needed to port simulation data to device test environments.
In addition, define extensions to support the definition of subelement tests and to define the mechanisms to integrate those tests into a complete device test. This effort is to be performed in conjunction with IEEE Std 1500TM-2005 [B6] and IEEE P1450.6 [B5], which are defining standards for the definition and integration of embedded cores.
Finally, define the constructs necessary to correlate test failure information back to the design environment, to allow debug and diagnosis operations to be performed based on failure information in STIL format.
4Syntax in this document that is used in the definition of patterns for sub-blocks is summarized in Annex O.
Structures are defined in STIL to support the definition of test patterns for sub-blocks of a design4 (i.e., embedded cores) such that these tests can be incorporated into a complete higher level device test.
Structures are defined in STIL to relate fail information from device testing environments back to original stimulus and design data elements.
Purpose
The STIL language definition is enhanced to support the usage of STIL in the design environment, which includes extending the execution concept to support STIL as a stimulus language, to allow STIL to be used as an intermediate form of data, and to allow STIL to capture design information needed to port simulation data to device test environments.
In addition, define extensions to support the definition of subelement tests and to define the mechanisms to integrate those tests into a complete device test. This effort is to be performed in conjunction with IEEE Std 1500TM-2005 [B6] and IEEE P1450.6 [B5], which are defining standards for the definition and integration of embedded cores.
Finally, define the constructs necessary to correlate test failure information back to the design environment, to allow debug and diagnosis operations to be performed based on failure information in STIL format.
4Syntax in this document that is used in the definition of patterns for sub-blocks is summarized in Annex O.