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IEEE 592
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IEEE 592 2007 Edition, December 5, 2007 Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Connectors
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Description / Abstract:
This standard covers design tests for shield resistance and a
simulated fault-current initiation for exposed semiconducting
shields used on cable accessories, specifically joints and
separable insulated connectors rated 15 kV through 35 kV.