IEEE 759

Description / Abstract: (This Foreword is not a part of ANSI/IEEE Std 759-1984, IEEE Standard Test Procedures for Semiconductor Energy X-Ray Spectrometers.)

This document presents standard test procedures for semiconductor X-ray energy spectrometers. Such systems consist of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse height analyzer/ computer. Companion documents are ANSI/IEEE Std 300-1982, IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors, ANSI/IEEE Std 301-1976, IEEE Standard Test Procedures for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors for Ionizing Radiation, and ANSI/IEEE Std 325-1971, IEEE Standard Test Procedures for Germanium Gamma-Ray Detectors.

This document presents standard test procedures for semiconductor X-ray energy spectrometers. Such systems consist of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse height analyzer/ computer. Test procedures for pulse-height analyzers and computers are not covered in this document. Section 5. is essentially tutorial.

This standard is not intended to imply that all tests described herein are mandatory, but only that such tests as are carried out shall be performed in accordance with the procedures described herein.

Companion documents to this standard are ANSI/IEEE Std 300-1982 [1],¹ ANSI/IEEE Std 301-1976 [2], and ANSI/IEEE Std 325-1971 [3].

The list of symbols and the glossary were derived from those in the companion documents.

Contrary to previous convention in the X-ray spectroscopy field, this document utilizes the characteristic energy E of the X-ray rather than its wavelength λ. This approach is consistent with the fact that the basic quantity measured by this type of spectrometer is the X-ray energy. A convenient conversion is provided by the relationship