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Description / Abstract:
This standard defines a mixed-signal test bus architecture that
provides the means of control and access to both analog and digital
test signals such that the testability structure for digital
circuits described in IEEE Std 1149.1-2001 has been extended
effectively to provide similar facilities for mixed-signal
circuits. In addition to testing of interconnections in the
conventional sense of IEEE Std 1149.1-2001, the mixed-signal test
bus defined by this standard also provides the means for parametric
testing and, optionally, the means to access internal test
structures. The standard does not mandate implementation details of
the test circuitry, although examples of conformant implementations
are given for illustration. Further, the standard develops
extensions to Boundary-Scan Description Language (BSDL) as a means
of describing key aspects of the implementation of this standard
within a particular component. At present, the extensions to BSDL
defined by this standard specifically omit the description of any
and all analog parameters defined by the standard.
Purpose
Where structures defined by this standard are incorporated into mixed-signal circuits, the testability problems posed by such circuits are mitigated by way of improving the controllability and observability of mixed-signal designs and supporting mixed-signal built-in test structures in order to reduce both test development time and testing costs and to improve test quality. In particular, these standardized test features allow mixed-signal (analog and/or digital) electronic components, printed circuit assemblies, and electronic systems to be accessible to external or built-in test equipment for interconnect test, parametric test, and internal test. A further purpose of this standard is to define the descriptive elements of BSDL and specified extensions sufficient to support the development of automated test algorithms used for testing interconnections between devices that adhere to this standard and, where practical, between such devices intermixed with devices that incorporate IEEE Std 1149.1-2001 or IEEE Std 1149.6TM-2003 as well. The descriptive elements defined by this standard also largely support the automated construction of analog tests for external components attached to or between components that implement this standard with the caveat that such tests may subsequently require modification to account for undocumented analog features within the conformant components.
Purpose
Where structures defined by this standard are incorporated into mixed-signal circuits, the testability problems posed by such circuits are mitigated by way of improving the controllability and observability of mixed-signal designs and supporting mixed-signal built-in test structures in order to reduce both test development time and testing costs and to improve test quality. In particular, these standardized test features allow mixed-signal (analog and/or digital) electronic components, printed circuit assemblies, and electronic systems to be accessible to external or built-in test equipment for interconnect test, parametric test, and internal test. A further purpose of this standard is to define the descriptive elements of BSDL and specified extensions sufficient to support the development of automated test algorithms used for testing interconnections between devices that adhere to this standard and, where practical, between such devices intermixed with devices that incorporate IEEE Std 1149.1-2001 or IEEE Std 1149.6TM-2003 as well. The descriptive elements defined by this standard also largely support the automated construction of analog tests for external components attached to or between components that implement this standard with the caveat that such tests may subsequently require modification to account for undocumented analog features within the conformant components.