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IEEE 1505.1
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IEEE 1505.1 2015 Edition, December 1, 2015 The Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
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Description / Abstract:
The scope of this standard is the definition of a pin map
utilizing the IEEE 1505™ 1 receiver fixture interface
(RFI). The pin map defined within this standard shall apply to
military and aerospace automatic test equipment (ATE) testing
applications.
Purpose
Standardization of a common input/output (I/O) will enable the interoperability of IEEE 1505 compliant interface fixtures [also known as interface test adapters (ITA), interface devices (IDs), or interconnecting devices (ICDs)] on multiple ATE systems utilizing the IEEE 1505 RFI.
1 Information on references can be found in Clause 2.
Purpose
Standardization of a common input/output (I/O) will enable the interoperability of IEEE 1505 compliant interface fixtures [also known as interface test adapters (ITA), interface devices (IDs), or interconnecting devices (ICDs)] on multiple ATE systems utilizing the IEEE 1505 RFI.
1 Information on references can be found in Clause 2.