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ISO 17915:2018
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ISO 17915:2018
Optics and photonics — Measurement method of semiconductor lasers for sensingMore info
This document describes methods of measuring temperature and injected current dependence of lasing wavelengths, and lasing spectral line width in relation to semiconductor lasers for sensing applications.
This document is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields.
| Author | ISO/TC 172/SC 9 Laser and electro-optical systems |
|---|---|
| Editor | ISO |
| Document type | Standard |
| Format | Paper |
| Edition | 1 |
| ICS | 31.260 : Optoelectronics. Laser equipment
|
| Number of pages | 29 |
| Replace | ISO/TS 17915:2013 |
| Weight(kg.) | 0.1493 |
| Year | 2018 |
| Country | Switzerland |