Full Description

This document gives guidelines for the characterization of single-wall carbon nanotubes (SWCNTs)using near infrared (NIR) photoluminescence (PL) spectroscopy.

It provides a measurement method for the determination of the chiral indices of the semi-conductingSWCNTs in a sample and their relative integrated PL intensities.

The method can be expanded to estimate the relative mass concentrations of semi-conducting SWCNTsin a sample from their measured integrated PL intensities and knowledge of their PL cross-sections.

Cross References:
ISO/TS 80004-4
ISO/TS 80004-6


All current amendments available at time of purchase are included with the purchase of this document.

Product Details

Published: 12/13/2019 ISBN(s): 9780539034493 Number of Pages: 26 File Size: 1 file , 2.1 MB Same As: ISO/TS 10867:2019 Product Code(s): 30389138, 30389138, 30389138