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BS CECC 00013:1985

M00005285

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BS CECC 00013:1985 Harmonized system of quality assessment for electronic components: basic specification: scanning electron microscope inspection of semiconductor dice

standard by BSI Group, 08/30/1985

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Describes equipment and procedures to be used for SEM inspection of discrete semiconductor devices and integrated circuits.

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Published: 08/30/1985 ISBN(s): 0580146022 Number of Pages: 28 File Size: 1 file , 820 KB Product Code(s): 00140153, 00140153, 00140153