Cart
0
Product
Products
(empty)
No products
To be determined
Shipping
$0.00
Total
Product successfully added to your shopping cart
Quantity
Total
There are 0 items in your cart.
There is 1 item in your cart.
Total products
Total shipping
To be determined
Total
Reduced price!
View larger
View larger
BS 11/30230316 DC
M00000162
New product
BS 11/30230316 DC BS EN 62047-18. Semiconductor devices. Micro-electromechanical systems. Part 18. Bending test methods of thin film materials
standard by BSI Group, 02/21/2011
In stock
More info
Full Description
Cross References:
IEC 62047-2:2006
IEC 62047-2:2006
IEC 62047-6:2009
All current amendments available at time of purchase are included with the purchase of this document.