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JIS Z 4615:2007 (R2017)
JIS Z 4615:2007 (R2017) Measurement of the effective focal spot size for industrial X-ray apparatus
$10.50 $25.00 -58%Reduced price!In Stock -
JIS C 61000-4-7:2007 (R2017)
JIS C 61000-4-7:2007 (R2017) Electromagnetic compatibility (EMC) - Part 4-7: Testing and measurement techniques - General guide on harmonics and interharmonics measurements and instrumentation, for power supply systems and equipment connected thereto
$21.08 $50.18 -58%Reduced price!In Stock -
JIS X 4178:2007 (R2016)
JIS X 4178:2007 (R2016) XForms 1.0
$30.41 $72.41 -58%Reduced price!In Stock -
JIS C 2134:2007 (R2017)
JIS C 2134:2007 (R2017) Method for the determination of the proof and the comparative tracking indices of solid insulating materials
$15.23 $36.27 -58%Reduced price!In Stock -
JIS X 4169:2007 (R2016)
JIS X 4169:2007 (R2016) XSL Transformations (XSLT) Version 1.0
$26.32 $62.66 -58%Reduced price!In Stock -
JIS X 4160:2007 (R2016)
JIS X 4160:2007 (R2016) XML Path Language (XPath) Version 1.0
$17.58 $41.86 -58%Reduced price!In Stock -
JIS B 8561:2007 (R2017)
JIS B 8561:2007 (R2017) Vending machines - Test methods
$17.58 $41.86 -58%Reduced price!In Stock -
JIS C 9335-2-6/ERRATUM 1:2007
JIS C 9335-2-6/ERRATUM 1:2007 ERRATUM
$84.00 $200.00 -58%Reduced price!In Stock -
JIS C 9335-2-5/ERRATUM 1:2007
JIS C 9335-2-5/ERRATUM 1:2007 ERRATUM
$84.00 $200.00 -58%Reduced price!In Stock -
JIS C 9335-2-6/ERRATUM 1:2007
JIS C 9335-2-6/ERRATUM 1:2007 ERRATUM
$84.00 $200.00 -58%Reduced price!In Stock -
JIS C 9335-2-15/ERRATUM 1:2007
JIS C 9335-2-15/ERRATUM 1:2007 ERRATUM
$84.00 $200.00 -58%Reduced price!In Stock -
JIS C 9335-2-15/ERRATUM 1:2007
JIS C 9335-2-15/ERRATUM 1:2007 ERRATUM
$84.00 $200.00 -58%Reduced price!In Stock
