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JIS There are 12168 products.
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JIS K 0163:2010 (R2015)
JIS K 0163:2010 (R2015) Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials
$10.50 $25.00 -58%Reduced price!In Stock -
JIS K 0161:2010 (R2015)
JIS K 0161:2010 (R2015) Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
$10.50 $25.00 -58%Reduced price!In Stock -
JIS K 0162:2010 (R2015)
JIS K 0162:2010 (R2015) Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
$10.50 $25.00 -58%Reduced price!In Stock -
JIS K 0190:2010 (R2015)
JIS K 0190:2010 (R2015) Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
$10.50 $25.00 -58%Reduced price!In Stock -
JIS K 6217-5:2010 (R2015)
JIS K 6217-5:2010 (R2015) Carbon black for rubber industry - Fundamental characteristics - Part 5 : Determination of tinting strength
$10.50 $25.00 -58%Reduced price!In Stock -
JIS A 5558:2010 (R2015)
JIS A 5558:2010 (R2015) Unplasticized polyvinyl chloride (PVC-U) profiles for fabrication of windows and doors
$10.50 $25.00 -58%Reduced price!In Stock -
JIS C 9335-2-202/ERRATUM 1:2010
JIS C 9335-2-202/ERRATUM 1:2010 ERRATUM
$84.00 $200.00 -58%Reduced price!In Stock -
JIS B 1702-3/ERRATUM 1:2010
JIS B 1702-3/ERRATUM 1:2010 ERRATUM
$84.00 $200.00 -58%Reduced price!In Stock -
JIS B 1702-3/ERRATUM 1:2010
JIS B 1702-3/ERRATUM 1:2010 ERRATUM
$84.00 $200.00 -58%Reduced price!In Stock -
JIS C 8282-2-2/ERRATUM 1:2010
JIS C 8282-2-2/ERRATUM 1:2010 ERRATUM
$84.00 $200.00 -58%Reduced price!In Stock -
JIS K 7365/ERRATUM 2:2010
JIS K 7365/ERRATUM 2:2010 ERRATUM
$84.00 $200.00 -58%Reduced price!In Stock -
JIS K 7381/ERRATUM 1:2010
JIS K 7381/ERRATUM 1:2010 ERRATUM
$84.00 $200.00 -58%Reduced price!In Stock
