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JIS C 8366/AMENDMENT 1:2012 (R2017)...
JIS C 7801/AMENDMENT 1:2012 Measuring methods of lamps for general lighting (Amendment 1)
JIS C 5101-26-1:2012 (R2017) Fixed capacitors for use in electronic equipment - Part 26-1: Blank detail specification - Fixed aluminium electrolytic capacitors with conductive polymer solid electrolyte - Assessment level EZ
JIS C 5402-13-2:2012 (R2017) Connectors for electronic equipment - Tests and measurements - Part 13-2: Mechanical operation tests - Test 13b: Insertion and withdrawal forces
JIS C 5402-16-2:2012 (R2017) Connectors for electronic equipment - Tests and measurements - Part 16-2: Mechanical tests on contacts and terminations - Test 16b: Restricted entry
JIS C 5402-16-4:2012 (R2017) Connectors for electronic equipment - Tests and measurements - Part 16-4: Mechanical tests on contacts and terminations - Test 16d:Tensile strength (crimped connections)
JIS C 5402-16-5:2012 (R2017) Connectors for electronic equipment - Tests and measurements - Part 16-5: Mechanical tests on contacts and terminations - Test 16e: Gauge retention force (resilient contacts)
JIS C 5402-16-7:2012 (R2017) Connectors for electronic equipment - Tests and measurements - Part 16-7: Mechanical tests on contacts and terminations - Test 16g: Measurement of contact deformation after crimping
JIS C 8152-1:2012 Photometry of white light emitting diode for general lighting - Part 1: LED packages
JIS C 8152-2:2012 Photometry of white light emitting diode for general lighting - Part 2: LED modules and LED light engines
JIS C 61000-4-2:2012 (R2017) Electromagnetic compatibility (EMC) - Part 4-2: Testing and measurement techniques - Electrostatic discharge immunity test
JIS R 1693-1:2012 (R2017) Measurement method for emissivity of fine ceramics and ceramic matrix composites - Part 1: Normal spectral emissivity by black body reference method using FTIR
JIS R 1693-2:2012 (R2017) Measurement method for emissivity of fine ceramics and ceramic matrix composites - Part 2: Normal emissivity by reflective method using FTIR