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JIS K 0213:2014 Technical terms for...
JIS C 5630-12:2014 Semiconductor devices - Micro-electromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures
JIS C 5402-15-2:2014 Connectors for electronic equipment - Tests and measurements - Part 15-2: Connector tests (mechanical) - Test 15b: Insert retention in housing (axial)
JIS C 5402-15-3:2014 Connectors for electronic equipment - Tests and measurements - Part 15-3: Connector tests (mechanical) - Test 15c: Insert retention in housing (torsional)
JIS C 5402-15-5:2014 Connectors for electronic equipment - Tests and measurements - Part 15-5: Connector tests (mechanical) - Test 15e: Contact retention in insert, cable nutation
JIS C 5402-16-1:2014 Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage
JIS C 5402-16-6:2014 Connectors for electronic equipment - Tests and measurements - Part 16-6: Mechanical tests on contacts and terminations - Test 16f: Robustness of terminations
JIS C 61000-4-20:2014 Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
JIS C 61000-4-22:2014 Electromagnetic compatibility (EMC) - Part 4-22: Testing and measurement techniques - Radiated emissions and immunity measurements in fully anechoic rooms (FARs)
JIS C 0508-2:2014 Functional safety of electrical/electronic/programmable electronic safety-related systems - Part 2: Requirements for electrical/electronic/programmable electronic safety-related systems
JIS C 5532:2014 Loudspeakers for sound system equipment
JIS C 0508-3:2014 Functional safety of electrical/electronic/programmable electronic safety-related systems - Part 3: Software requirements